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Model: CV-2100
Contour measuring machine Mitutoyo CV‑2100 Series 218 shortens measurement time by placing all control buttons—such as probe positioning, start, stop, and return—on the front of the drive unit for easy access. The device allows step adjustment of the X-axis using a rotary knob, while the CV‑2100M4 model features a fast-moving Z-axis for more flexible alignment. The Z1 detector uses an arc-scale system to achieve high measurement accuracy.
Model: FTA-H3000
- You can carry out simultaneous analysis of roughness and contour with one measurement.
- The measuring range is enormous with Z1 = 16 mm.
- The high drive speed reduces the total measurement time.
- Optional retrofit kits for pure surface roughness or dual contour measurement, detector change using the “hot swap method”.